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In technologies affected by variability, the detection status of a small-delay fault may vary among manufactured circuit instances. The same fault may be detected, missed or provably undetectable in different circuit instances. We introduce the first complete flow to accurately evaluate and systematically maximize the test quality under variability. As the number of possible circuit instances is infinite,...
During the last years, SAT-based ATPG has been proved to be a powerful complement of traditional structural approaches. It outperforms structural methods when applied to hard-to-detect faults, and it can be combined with advanced SAT solving techniques in order to compute provably optimal solutions to complex test generation problems with optimisation goals. However, one weakness of SAT-based ATPG...
We present SATSEQ, a timing-aware ATPG system for small-delay faults in non-scan circuits. The tool identifies the longest paths suitable for functional fault propagation and generates the shortest possible sub-sequences per fault. Based on advanced model-checking techniques, SATSEQ provides detection of small-delay faults through the longest functional paths. All test sequences start at the circuit's...
In this paper we describe a new approach to assess a circuit's vulnerability to fault attacks. This is achieved through analysis of the circuit's design specification, making use of modern SAT solving techniques. For each injectable fault, a corresponding SAT instance is generated. Every satisfying solution for such an instance is equivalent to a circuit state and an input assignment for which the...
Post-silicon validation, i.e., physical characterization of a small number of fabricated circuit instances before start of high-volume manufacturing, has become an essential step in integrated circuit production. Post-silicon validation is required to identify intricate logic or electrical bugs which could not be found during pre-silicon verification. In addition, physical characterization is useful...
Power droop is a non-trivial signal-integrity-related effect triggered by specific power-supply conditions. High-frequency and low-frequency power droop may lead to failure of an IC during application time, but they usually remain undetected by state-of-the-art manufacturing test methods, as the fault excitation imposes particular conditions on global switching activity over several time frames. Hence,...
Failures caused by phenomena such as crosstalk or power-supply noise are gaining in importance in advanced nanoscale technologies. The detection of such complex defects benefits from the satisfaction of certain constraints, for instance justifying specific transitions on neighbouring lines of the defect location. We present a SAT-based ATPG-tool that supports the enhanced conditional multiple-stuck-at...
Test pattern generation for sequential circuits benefits from scanning strategies as these allow the justification of arbitrary circuit states. However, some of these states may be unreachable during normal operation. This results in non-functional operation which may lead to abnormal circuit behaviour and result in over-testing. In this work, we present a versatile approach that combines a highly...
Adequate coverage of small-delay defects in circuits affected by statistical process variations requires identification and sensitization of multiple paths through potential defect sites. Existing K longest path generation (KLPG) algorithms use a data structure called path store to prune the search space by restricting the number of sub-paths considered at the same time. While this restriction speeds...
The detection of small-delay faults is traditionally performed by sensitizing transitions on a path of sufficient length from an input to an output of the circuit going through the fault site. While this approach allows efficient test generation algorithms, it may result in false positives and false negatives as well, i.e. undetected faults are classified as detected or detectable faults are classified...
We present a versatile method that enumerates all or a user-specified number of longest sensitisable paths in the whole circuit or through specific components. The path information can be used for design and test of circuits affected by statistical process variations. The algorithm encodes all aspects of the path search as an instance of the Boolean Satisfiability Problem (SAT), which allows the method...
Nanoscale integrated circuits suffer both from high defect densities and increased parameter variations possibly affecting the overall timing behaviour. Components with a higher vulnerability to process variations are not just critical during test design and test application, but also during normal operation. In particular, ageing effects and changes in the operation environment including supply voltage,...
Efficient utilization of the inherent parallelism of multi-core architectures is a grand challenge in the field of electronic design automation (EDA). One EDA algorithm associated with a high computational cost is automatic test pattern generation (ATPG). We present the ATPG tool TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and...
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