The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
With process technology development and circuit density rapidly increases, shrinkage of semiconductor device geometries has become extremely difficult to effectively analyze defect. Therefore, an exactness failure analysis process flow and technique need to be considered in order to analyze the failure mechanism, especially complex failure analysis such as failure of open/floating signal net in logic...
This paper describes the analysis approach and methodology when dealing with Digital Quiescent current (IDDQ) most common issue, a vector dependency current drift. A typical Design for Testability (DFT) test structure are used as vehicle to exemplified the approaches that used in the lab scale that probably be the ultimate solution to overcome limitation on most of the lab. A special analysis flow...
This paper describes analysis method on the negative current IDDQ failure mode. By using Visual C++ programmable script to control the steps of IDDQ measurement, circuit debugging is possible. This method helps on the findings of threshold voltage shifted on Disable pin which crucial for IDDQ test mode ofthat particular device.
This paper describes analysis method on the nontrivial scan test failure eventually lead to the findings of defective via with capacitive interconnect. The observation of short time photon emission event and multiple spot locations that vary against fails vector are the challenging scenario of this fail mode.
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.