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Previous work on the Carnegie Mellon Logic Characterization Vehicle (CM-LCV) has emphasized the diagnosability properties of a specific class of regular circuits called functional unit block arrays (FUB arrays). This paper describes a multiple-defect, two-level diagnosis procedure that leverages these unique properties of the FUB array to significantly improve diagnosis. This custom diagnosis procedure...
Rapid yield learning in a new manufacturing process via test chips is greatly enhanced with a “Design for Diagnosis” methodology. Prior work on logic-based test chip design demonstrated an implementation flow that ensures 100% intra-cell fault coverage using a minimal test set. However, testability alone does not guarantee good diagnosability. Since diagnosis is inherently a function of design, it...
A comprehensive investigation of new integrated circuit (IC) design and fabrication technologies is crucial for yielding reliable ICs. This work describes the state of a novel test chip design methodology that results in a test chip referred to as the Carnegie Mellon Logic Characterization Vehicle (CM-LCV). Experiments show that the CM-LCV is able to achieve single stuck line fault coverage of up...
A comprehensive investigation of new integrated circuit design and fabrication technologies is crucial for yielding reliable parts. Prior work proposed a novel logic characterization vehicle called the Carnegie Mellon Logic Characterization Vehicle (CM-LCV), and an implementation flow that ensures a test chip to be product-like with near optimal testability and diagnosability. This work describes...
Fast and efficient analysis of test chips is crucial for effective yield learning. Prior work proposed the Carnegie-Mellon logic characterization vehicle (CM-LCV) as an improved test chip for yield learning. The highly regular nature of the CM-LCV test chip is particularly appealing for BIST; the current work describes a BIST scheme that achieves 100% input-pattern fault coverage with an 86.9% reduction...
A new type of logic characterization vehicle (LCV) that optimizes design, test, and diagnosis for yield learning is described. The Carnegie-Mellon LCV (CM-LCV) uses constant-testability theory and logic/layout regularity to create a parameterized design that exhibits both front- and back-end characteristics of a product-like, customer design. Design and test analysis of various CM-LCV designs (one...
Physically Unclonable Functions (PUFs) are structures with many applications, including device authentication, identification, and cryptographic key generation. In this paper we propose a new PUF, called SCAN-PUF, based on scan-chain power-up states. We argue that scan chains have multiple characteristics that make them uniquely suited as a low-cost PUF. We present results from test chips fabricated...
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