Search results for: Joeri De Vos
SID Symposium Digest of Technical Papers > 54 > 1 > 25 - 28
SID Symposium Digest of Technical Papers > 53 > 1 > 748 - 751
Microelectronics Reliability > 2017 > 79 > C > 297-305
Applied Surface Science > 2017 > 404 > C > 82-87
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2723 - 2726