Search results for: Kun-Han Tsai
IEEE Design & Test > 2016 > 33 > 6 > 23 - 30
IEEE Design & Test > 2016 > 33 > 2 > 9 - 16
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2014 > 33 > 8 > 1258 - 1268
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2014 > 33 > 3 > 476 - 488