Search results for: Richard G. Southwick
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 23 - 30
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-4.1 - 2D-4.7
2016 IEEE International Electron Devices Meeting (IEDM) > 31.1.1 - 31.1.4
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2943 - 2949
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 201 - 207