Search results for: E. Bahat-Treidel
Solid-State Electronics > 2016 > 125 > C > 118-124
Microelectronics Reliability > 2016 > 64 > C > 556-559
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
Microelectronics Reliability > 2016 > 58 > C > 177-184
Microelectronics Reliability > 2014 > 54 > 9-10 > 2191-2195
2013 IEEE International Electron Devices Meeting > 6.1.1 - 6.1.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.1.1 - 3C.1.7
Microelectronics Reliability > 2012 > 52 > 9-10 > 2426-2430
IEEE Electron Device Letters > 2012 > 33 > 3 > 357 - 359
Microelectronics Reliability > 2011 > 51 > 9-11 > 1710-1716
Microelectronics Reliability > 2011 > 51 > 2 > 217-223
IEEE Electron Device Letters > 2009 > 30 > 9 > 901 - 903
IEEE Transactions on Electron Devices > 2009 > 56 > 3 > 361 - 364
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3354 - 3359