Search results for: A. Stocco
Microelectronics Reliability > 2015 > 55 > 9-10 > 1662-1666
Microelectronics Reliability > 2014 > 54 > 9-10 > 2237-2241
Microelectronics Reliability > 2014 > 54 > 9-10 > 2213-2216
2014 IEEE International Reliability Physics Symposium > CD.11.1 - CD.11.4
Microelectronic Engineering > 2013 > 109 > Complete > 257-261
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.1.1 - 3C.1.7
2012 International Electron Devices Meeting > 13.3.1 - 13.3.4
Microelectronics Reliability > 2012 > 52 > 9-10 > 2426-2430
2012 IEEE International Reliability Physics Symposium (IRPS) > CD.2.1 - CD.2.4
Colloids and Surfaces A: Physicochemical and Engineering Aspects > 2011 > 391 > 1-3 > 112-118
Microelectronics Reliability > 2009 > 49 > 9-11 > 1207-1210
The European Physical Journal E > 2009 > 30 > 4 > 431-438
The European Physical Journal E > 2009 > 29 > 1 > 95-105