Search results for: A. Vandooren
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-3.1 - 2B-3.5
physica status solidi c > 12 > 8 > 1160 - 1165
physica status solidi c > 12 > 3 > 275 - 281
Microelectronic Engineering > 2015 > 132 > C > 218-225
2014 IEEE International Electron Devices Meeting > 30.2.1 - 30.2.4