Search results for: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3519 - 3523
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1996 - 2002
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-1-1 - EL-1-4
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3193 - 3198
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3625 - 3631
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 2 > 914 - 921
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 110 - 118
2012 IEEE International Reliability Physics Symposium (IRPS) > EL.3.1 - EL.3.5
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
IEEE Journal of Solid-State Circuits > 2011 > 46 > 2 > 537 - 545