Search results for: Chun-Lung Hsu
Journal of Electronic Testing > 2019 > 35 > 4 > 485-495
Journal of Electronic Testing > 2016 > 32 > 2 > 111-123
International Journal of Circuit Theory and Applications > 40 > 5 > 489 - 502
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 4 > 665 - 672
2011 IEEE International SOC Conference > 213 - 218
IEEE Transactions on Computers > 2011 > 60 > 5 > 628 - 638
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2010 > 18 > 2 > 319 - 324
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 7 > 2196 - 2208
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 7 > 2300 - 2315
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 6 > 1897 - 1906