Search results for: Chun-Lung Hsu
Journal of Electronic Testing > 2019 > 35 > 4 > 485-495
Journal of Electronic Testing > 2016 > 32 > 2 > 111-123
Journal of Signal Processing Systems > 2008 > 52 > 3 > 211-229
Journal of Electronic Testing > 2004 > 20 > 1 > 39-44