Search results for: N Defrance
Current Applied Physics > 2017 > 17 > 12 > 1601-1608
Microelectronics Reliability > 2016 > 64 > C > 594-598
IEEE Electron Device Letters > 2016 > 37 > 5 > 553 - 555
physica status solidi c > 11 > 3‐4 > 498 - 501
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1054 - 1059
IEEE Electron Device Letters > 2013 > 34 > 1 > 36 - 38
physica status solidi c > 9 > 3‐4 > 1083 - 1087
Electronics Letters > 2012 > 48 > 2 > 69 - 71
IEEE Electron Device Letters > 2011 > 32 > 11 > 1537 - 1539
Electronics Letters > 2011 > 47 > 3 > 212 - 214