Search results for: O. Aubel
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 455 - 460
Microelectronics Reliability > 2014 > 54 > 9-10 > 1671-1674
2013 IEEE International Reliability Physics Symposium (IRPS) > 2C.1.1 - 2C.1.6
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.1.1 - 2F.1.5
Microelectronic Engineering > 2012 > 92 > Complete > 107-110
Microelectronic Engineering > 2010 > 87 > 11 > 2119-2123
Microelectronic Engineering > 2008 > 85 > 10 > 2042-2046