Search results for: N. Collaert
Journal of Crystal Growth > 2018 > 484 > C > 86-91
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
IEEE Journal of the Electron Devices Society > 2017 > 5 > 6 > 480 - 484
Materials Science in Semiconductor Processing > 2017 > 62 > C > 2-12
2017 IEEE International Reliability Physics Symposium (IRPS) > 2B-3.1 - 2B-3.5
IEEE Electron Device Letters > 2017 > 38 > 3 > 314 - 317
Solid-State Electronics > 2017 > 128 > C > 109-114
Solid-State Electronics > 2017 > 128 > C > 102-108
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 15.6.1 - 15.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4