Search results for: A. Gasperin
2009 31st EOS/ESD Symposium > 1 - 8
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2218 - 2224
IEEE Transactions on Electron Devices > 2009 > 56 > 10 > 2319 - 2326
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3189 - 3196
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 2090 - 2097
Microelectronics Reliability > 2007 > 47 > 4-5 > 602-605
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2196 - 2203
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 1898 - 1905
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-1 > 1917 - 1922