Search results for: A. Chimenton
Inside NAND Flash Memories > 89-113
Microelectronics Reliability > 2012 > 52 > 6 > 1060-1064
2011 International Reliability Physics Symposium > 2G.2.1 - 2G.2.6
2011 International Reliability Physics Symposium > MY.4.1 - MY.4.5
Solid State Electronics > 2011 > 58 > 1 > 23-27
IEEE Electron Device Letters > 2010 > 31 > 3 > 198 - 200
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1454 - 1458
IEEE Transactions on Electron Devices > 2007 > 54 > 9 > 2438 - 2444
Microelectronics Reliability > 2006 > 46 > 9-11 > 1478-1481