Search results for: L. Bolzani
Journal of Electronic Testing > 2019 > 35 > 2 > 191-200
Microelectronics Reliability > 2016 > 67 > C > 150-158
Journal of Electronic Testing > 2016 > 32 > 3 > 315-328
Acta Psychiatrica Scandinavica > 133 > 1 > 34 - 43
Journal of Electronic Testing > 2014 > 30 > 2 > 159-169
Journal of Electronic Testing > 2012 > 28 > 6 > 777-789