Search results for: T. Rudenko
NATO Science for Peace and Security Series B: Physics and Biophysics > Nanoscaled Semiconductor-on-Insulator Structures and Devices > Reliability and Characterization of Nanoscaled SOI Devices > 199-220
Solid-State Electronics > 2016 > 117 > C > 66-76
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Diagnostics of the SOI Devices > 323-339
Budownictwo i Architektura > 2016 > Vol. 15, nr 4 > 41--51
Solid State Electronics > 2014 > 97 > Complete > 52-58
Microelectronic Engineering > 2013 > 109 > Complete > 326-329
Solid State Electronics > 2010 > 54 > 2 > 164-170
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3532 - 3541
Solid State Electronics > 2007 > 51 > 11-12 > 1466-1472
IEEE Electron Device Letters > 2007 > 28 > 9 > 834 - 836
Solid State Electronics > 2005 > 49 > 9 > 1488-1496
Microelectronic Engineering > 2005 > 80 > Complete > 386-389
Solid State Electronics > 2004 > 48 > 3 > 389-399
Electron Technology > 1999 > Vol. 32, No. 1/2 > 110-115