Search results for: M. Jurczak
2016 IEEE International Electron Devices Meeting (IEDM) > 21.4.1 - 21.4.4
Solid-State Electronics > 2016 > 125 > C > 189-197
Solid-State Electronics > 2016 > 125 > C > 198-203
IEEE Electron Device Letters > 2016 > 37 > 9 > 1112 - 1115
NATO Science for Peace and Security Series B: Physics and Biophysics > Nanoscaled Semiconductor-on-Insulator Structures and Devices > Reliability and Characterization of Nanoscaled SOI Devices > 199-220
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-1-1 - 6C-1-7
Solid-State Electronics > 2016 > 117 > C > 123-129
Lecture Notes in Electrical Engineering > Emerging Technologies and Circuits > Advanced Devices and Circuits > 55-66
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Physics of Modern SemOI Devices > 141-153
2015 IEEE International Electron Devices Meeting (IEDM) > 10.6.1 - 10.6.4