Search results for: Chang-Lin Yeh
Microelectronics Reliability > 2007 > 47 > 12 > 2188-2196
Microelectronics Reliability > 2007 > 47 > 12 > 2179-2187
International Journal of Impact Engineering > 2007 > 34 > 10 > 1655-1667
Microelectronics Reliability > 2007 > 47 > 8 > 1239-1245
Microelectronics Reliability > 2007 > 47 > 7 > 1127-1134
IEEE Transactions on Electronics Packaging Manufacturing > 2007 > 30 > 1 > 54 - 62
IEEE Transactions on Electronics Packaging Manufacturing > 2007 > 30 > 1 > 84 - 91
Microelectronic Engineering > 2007 > 84 > 1 > 87-94
Microelectronics Reliability > 2006 > 46 > 7 > 1172-1182