Search results for: J. Kuzmik
Applied Surface Science > 2017 > 426 > C > 656-661
Microelectronics Reliability > 2017 > 76-77 > C > 338-343
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
physica status solidi (a) > 212 > 5 > 1086 - 1090
Applied Surface Science > 2014 > 312 > C > 157-161
Solid State Electronics > 2012 > 67 > 1 > 74-78
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 720 - 724
IEEE Transactions on Electron Devices > 2010 > 57 > 9 > 2144 - 2154
IEEE Electron Device Letters > 2009 > 30 > 10 > 1030 - 1032
Electronics Letters > 2009 > 45 > 11 > 570 - 572
IEEE Transactions on Electron Devices > 2008 > 55 > 3 > 937 - 941