Search results for: B. Vermeersch
International Journal of Thermal Sciences > 2010 > 49 > 8 > 1319-1332
Microelectronics Journal > 2009 > 40 > 9 > 1411-1416
International Communications in Heat and Mass Transfer > 2009 > 36 > 3 > 210-212
Microelectronics Reliability > 2008 > 48 > 5 > 734-738
International Journal of Heat and Mass Transfer > 2007 > 50 > 21-22 > 4457-4460
Microelectronics Reliability > 2007 > 47 > 8 > 1233-1238
Engineering Analysis with Boundary Elements > 2007 > 31 > 4 > 289-298
Microelectronics Reliability > 2007 > 47 > 2-3 > 437-443
Ieee transactions on components and packaging technologies > 2007 > 30 > 4 > 660 - 665
Electronics and Telecommunications Quarterly > 2007 > Vol. 53, No 4 > 389-398