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This session explores how newly introduced standards are supporting innovative industry practices. First, a new update for 1149.1, including new instructions, extensions, and a new procedural language, is reviewed. Next, techniques for implementing concurrent test using P1687 are described. Finally, a method is examined, using P1581, for connectivity testing of ICs with no boundary scan.
This paper studies a new hold time failure mode found in deep sub-micron low power CMOS production scan testing. The root causes of failure are discovered and duplicated in simulations. Vccmin of scan chain integrity is defined and studied for the first time. Solutions for enhancing scan chain integrity are proposed.
Quiescent supply current (IDDQ) is a very effective test method for CMOS circuits. However, IDDQ vector verification and debugging may take considerable time and effort; various problems have been encountered in this process, so different tools and methodologies have been devised to address them. For pre-silicon IDDQ vector verification, a modular approach is adopted. IDDQ is estimated for each vector...
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