Search results for: F. Fantini
Fusion Engineering and Design > 2009 > 84 > 2-6 > 269-274
Microelectronics Reliability > 2008 > 48 > 8-9 > 1208-1211
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 240 - 247
IEEE Transactions on Electron Devices > 2008 > 55 > 7 > 1592 - 1602
Microelectronics Reliability > 2007 > 47 > 9-11 > 1639-1642
Microelectronics Reliability > 2006 > 46 > 9-11 > 1795-1799
Microelectronics Reliability > 2005 > 45 > 9-11 > 1321-1326
Heart Failure Reviews > 2004 > 9 > 4 > 307-315