Search results for: Ningyue Jiang
Microelectronics Reliability > 2013 > 53 > 3 > 409-413
Microelectronics Reliability > 2012 > 52 > 11 > 2568-2571
2007 7th International Conference on ASIC > 485 - 489
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-2 > 2361 - 2366
Materials Science in Semiconductor Processing > 2005 > 8 > 1-3 > 323-326