Search results for: Yung-Huei Lee
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 1959 - 1965
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2045 - 2051
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2107 - 2113
IEEE Electron Device Letters > 2008 > 29 > 1 > 106 - 108
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 74 - 83
IEEE Custom Integrated Circuits Conference 2006 > 571 - 574
Microelectronics Reliability > 2005 > 45 > 1 > 107-114
Microelectronics Reliability > 2001 > 41 > 5 > 689-696