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To test and to model the conducted radio frequency electromagnetic immunity of a reconfigurable integrated circuit like microcontrollers is complex because the configuration parameter is variable. A study is presented of the dependence of immunity on one of the configuration parameters - the system clock. The theoretical analysis shows that the immunity is independent of the clock frequency in the...
The conducted RF immunity of microcontrollers is sometimes strongly frequency dependent. This paper discovers one origin of the frequency behavior of the immunity of microcontrollers against electromagnetic disturbances on oscillator pins. The behavior is explained by considering resonances in current loops through oscillator pins. The proposed theory is verified by systematically measurements.
In this paper an application of Integral Analysis Techniques is demonstrated for determining the effect of large simultaneously switching IC Circuit Groups (internal IC-Circuits and I/O's ) on their Power Integrity (PI) and I/O-Signal Integrity (I/O-SI) behavior. The analysis includes the complex Packaging (CP+PCB). A large u-Controller and its wire-bonded Chip-Package(CP) plus its Test-PCB have been...
This paper presents an approach to constructing the immunity model of the microcontroller based on functional blocks. The microcontroller is treated as an assembly of functional blocks and propagation paths of electromagnetic interference. Function blocks are I/Os and cores where the interference propagation paths are referred to interconnections such as packages and on-chip power distribution network...
This paper presents an approach to simulate the immunity of the microcontroller based on dynamic, nonlinear and passive model. By introducing the dynamic elements, this modelling technique reflects both those dynamic and nonlinear behaviour of ports and cores of the microcontroller. It can simulate not only external interference from outside but also the internal interference of the microcontroller...
The electromagnetic emission of complex very large scale integrated circuits is determined by their operation activity plus the manifold noise propagation paths through the on-chip power routing, the package traces and the planes and traces on the printed circuit board. Good simulation models have to serve two main interests: (1) identification of emission-related IC design weaknesses and estimation...
The electromagnetic emission of complex very large scale integrated circuits is determined by their operation activity plus the manifold noise propagation paths through the on-chip power routing, the package traces and the planes and traces on the printed circuit board. The design of any emission test board influences the emission finally measured at defined probing connectors. Good simulation models...
The paper presents a new test method for pulse susceptibility of microcontrollers which reflects the electromagnetic environment of microcontrollers in practical applications. The method includes a set of electromagnetic interference pulses and their injection networks. The waveforms of the pulses are deduced from measurements on real application boards of microcontrollers.
The power integrity of the system chip plus chip package determines the RF emission potential and is thus a key quality parameter of complex integrated circuits like microcontrollers for automotive applications. However, modeling and simulation of power integrity and thus electromagnetic emission must be applied as early as possible in the IC design process. This paper presents two approaches: (1)...
Electromagnetic compatibility (EMC) becomes an increasingly important subject within the IC design process, because more and more market segments demand for low electromagnetic emission (EME) of integrated circuits. Therefore automatic emission model generation tools need to become part of the design flow. In this paper we present an automatic generation procedure of equivalent current sources (ECS)...
Increasing EMI potential of high-performance digital circuits like 32bit microcontrollers demand for switching current models and feasible ways to run netlist-based EMI simulations. A promising modeling approach for digital VLSI circuits is presented and a silicon test vehicle for correlation between models and measurements is described.
The experience described in this paper is valuable for both microcontroller/ASIC manufacturers and their customers. Based on the international standard IEC 61967 for electromagnetic emission characterization of clocked semiconductor devices, the most important test setups are described. The common usage of those test standards by semiconductor manufacturers enable the comparison of several design...
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