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This paper presents several capacitor types used on-chip and their applicability for on-chip decoupling. The concept of distributed RC power supply network is discussed as a possible solution of EMC problems in current CMOS technologies. Some simulation and measurement results performed on test chips and product IC show the efficiency of the demonstrated technique.
The electromagnetic emission of complex very large scale integrated circuits is determined by their operation activity plus the manifold noise propagation paths through the on-chip power routing, the package traces and the planes and traces on the printed circuit board. Good simulation models have to serve two main interests: (1) identification of emission-related IC design weaknesses and estimation...
The electromagnetic emission of complex very large scale integrated circuits is determined by their operation activity plus the manifold noise propagation paths through the on-chip power routing, the package traces and the planes and traces on the printed circuit board. The design of any emission test board influences the emission finally measured at defined probing connectors. Good simulation models...
A high speed and high bandwidth on-chip sampling sensor system has been developed and realized in a standard 130 nm single-well CMOS process to measure dynamic switching currents flowing into chip sub-modules and the resulting voltage drops on power supply lines. A test chip with the primary function to compare different on-chip decoupling techniques has been equipped with the sensor and manufactured...
The power integrity of the system chip plus chip package determines the RF emission potential and is thus a key quality parameter of complex integrated circuits like microcontrollers for automotive applications. However, modeling and simulation of power integrity and thus electromagnetic emission must be applied as early as possible in the IC design process. This paper presents two approaches: (1)...
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