Search results for: Gabriel L. Nazar
Journal of Electronic Testing > 2018 > 34 > 4 > 487-506
Microprocessors and Microsystems > 2017 > 51 > C > 264-274
Microelectronics Reliability > 2015 > 55 > 7 > 1109-1119
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2742 - 2749