Search results for: R. Degraeve
Materials Science in Semiconductor Processing > 2006 > 9 > 6 > 880-884
Microelectronics Reliability > 2006 > 46 > 5-6 > 702-712
Materials Science & Engineering R > 2006 > 51 > 4-6 > 37-85
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 509 - 516
IEEE Electron Device Letters > 2006 > 27 > 10 > 817 - 820
IEEE Transactions on Electron Devices > 2006 > 53 > 7 > 1657 - 1668
Microelectronic Engineering > 2005 > 80 > Complete > 182-185
Microelectronic Engineering > 2005 > 80 > Complete > 370-373
Microelectronic Engineering > 2005 > 80 > Complete > 366-369
Microelectronic Engineering > 2005 > 80 > Complete > 440-443
Microelectronics Reliability > 2005 > 45 > 5-6 > 815-818