Search results for: R. Degraeve
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3432 - 3441
2007 IEEE International Electron Devices Meeting > 501 - 504
Microelectronic Engineering > 2007 > 84 > 9-10 > 2354-2357
Microelectronic Engineering > 2007 > 84 > 9-10 > 1925-1928
Microelectronic Engineering > 2007 > 84 > 9-10 > 1943-1946
Microelectronic Engineering > 2007 > 84 > 9-10 > 1951-1955
Microelectronic Engineering > 2007 > 84 > 9-10 > 2067-2070
Microelectronics Reliability > 2007 > 47 > 4-5 > 559-566
IEEE Transactions on Electron Devices > 2007 > 54 > 4 > 752 - 758
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 2 > 310 - 314