Search results for: T. Kauerauf
2014 IEEE International Electron Devices Meeting > 20.2.1 - 20.2.4
2014 IEEE International Electron Devices Meeting > 34.4.1 - 34.4.4
Microelectronics Reliability > 2014 > 54 > 9-10 > 1675-1679
2014 IEEE International Reliability Physics Symposium > 6A.2.1 - 6A.2.6
2014 IEEE International Reliability Physics Symposium > 3C.4.1 - 3C.4.6
2014 IEEE International Reliability Physics Symposium > 3A.2.1 - 3A.2.6
Microelectronic Engineering > 2013 > 109 > Complete > 54-56
Microelectronic Engineering > 2013 > 109 > Complete > 250-256
2013 IEEE International Reliability Physics Symposium (IRPS) > 5C.6.1 - 5C.6.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.5.1 - 2F.5.5
Microelectronic Engineering > 2013 > 103 > Complete > 144-149
2011 International Electron Devices Meeting > 28.6.1 - 28.6.4
2011 International Reliability Physics Symposium > 3A.1.1 - 3A.1.8
2011 International Reliability Physics Symposium > 2A.2.1 - 2A.2.10