Search results for: Helmut Köck
IEEE Transactions on Power Electronics > 2016 > 31 > 4 > 3128 - 3140
Microelectronics Reliability > 2012 > 52 > 9-10 > 2374-2379
Microelectronics Reliability > 2011 > 51 > 9-11 > 1913-1918
Microelectronics Reliability > 2011 > 51 > 9-11 > 1954-1958
Microelectronics Reliability > 2009 > 49 > 9-11 > 1132-1136
Microelectronics Reliability > 2007 > 47 > 9-11 > 1790-1794