Wyniki wyszukiwania
IEEE Transactions on Power Electronics > 2014 > 29 > 6 > 3116 - 3131
IEEE Electron Device Letters > 2014 > 35 > 12 > 1284 - 1286
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3103 - 3110
IEEE Electron Device Letters > 2014 > 35 > 2 > 181 - 183
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4166 - 4174
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4498 - 4504
Microelectronics Journal > 2012 > 43 > 11 > 793-801
IEEE Journal of Solid-State Circuits > 2012 > 47 > 5 > 1075 - 1083
2011 International Reliability Physics Symposium > HV.1.1 - HV.1.4
2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
2011 International Reliability Physics Symposium > 2D.3.1 - 2D.3.6
2011 International Reliability Physics Symposium > 2A.3.1 - 2A.3.5
2011 International Reliability Physics Symposium > 5A.6.1 - 5A.6.6