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IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4197 - 4203
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 732 - 741
IEEE Electron Device Letters > 2014 > 35 > 8 > 823 - 825
IEEE Electron Device Letters > 2014 > 35 > 9 > 900 - 902
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3345 - 3349
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 950 - 952
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1284 - 1291
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3109 - 3114
IEEE Electron Device Letters > 2014 > 35 > 3 > 309 - 311
IEEE Transactions on Electron Devices > 2014 > 61 > 10 > 3379 - 3385
IEEE Electron Device Letters > 2014 > 35 > 2 > 253 - 255
2013 IEEE International Electron Devices Meeting > 29.6.1 - 29.6.4
2013 IEEE International Electron Devices Meeting > 32.4.1 - 32.4.4
2013 Spanish Conference on Electron Devices > 99 - 102
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3849 - 3855