Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2403 - 2408
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2080 - 2085
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 2 > 126 - 134
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-1.1 - CR-1.4