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IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 266 - 272
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3514 - 3520
Microelectronics Reliability > 2016 > 64 > C > 152-157
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3327 - 3334
IEEE Transactions on Nuclear Science > 2016 > 63 > 4-1 > 2002 - 2009
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 8 > 1176 - 1187
physica status solidi (a) > 213 > 7 > 1728 - 1737
Nuclear Instruments and Methods in Physics Research Section A: Accelerators,... > 2016 > 824 > C > 443-445
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 263 - 265