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IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 4 > 522 - 530
2009 31st EOS/ESD Symposium > 1 - 8
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 4 > 810 - 821
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 4 > 522 - 530
2009 31st EOS/ESD Symposium > 1 - 8
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 4 > 810 - 821