Search results
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 68 - 73
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 63 - 67
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 110 - 115
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 106 - 109
IEEE Electron Device Letters > 2018 > 39 > 1 > 59 - 62
IEEE Electron Device Letters > 2018 > 39 > 1 > 75 - 78
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 79 - 86
IEEE Electron Device Letters > 2018 > 39 > 1 > 71 - 74
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 207 - 214
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 45 - 50
IEEE Electron Device Letters > 2018 > 39 > 1 > 79 - 82
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 59 - 63
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4868 - 4874
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4875 - 4881
IEEE Electron Device Letters > 2017 > 38 > 12 > 1704 - 1707
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5171 - 5180
IEEE Electron Device Letters > 2017 > 38 > 11 > 1563 - 1566
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4435 - 4441
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4415 - 4423
IEEE Electron Device Letters > 2017 > 38 > 11 > 1567 - 1570