Wyniki wyszukiwania
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 708 - 712
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1622 - 1631
2016 IEEE International Conference on Dielectrics (ICD) > 2 > 1065 - 1068
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 42 - 51