Wyniki wyszukiwania
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 41 - 48
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 68 - 73
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 55 - 62
IEEE Journal of the Electron Devices Society > 2018 > 6 > 1 > 95 - 99
IEEE Transactions on Power Electronics > 2018 > 33 > 3 > 2509 - 2517
IEEE Transactions on Power Electronics > 2018 > 33 > 2 > 1585 - 1596
IEEE Electron Device Letters > 2018 > 39 > 1 > 95 - 98
IEEE Electron Device Letters > 2018 > 39 > 1 > 147 - 150
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 299 - 307
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 101 - 107
IEEE Transactions on Power Electronics > 2018 > 33 > 1 > 283 - 298
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 692 - 697
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5242 - 5248
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4838 - 4843
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4974 - 4979
IEEE Electron Device Letters > 2017 > 38 > 12 > 1759 - 1762
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4889 - 4896
IEEE Electron Device Letters > 2017 > 38 > 12 > 1680 - 1683
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 12 > 3115 - 3125