Search results
International Journal of Circuit Theory and Applications > 52 > 6 > 2956 - 2970
IEEJ Transactions on Electrical and Electronic Engineering > 16 > 3 > 486 - 487
Journal of Electronic Testing > 2019 > 35 > 3 > 401-412
Journal of Electronic Testing > 2018 > 34 > 6 > 717-733
Microelectronics Reliability > 2018 > 87 > C > 259-270
AEU - International Journal of Electronics and Communications > 2018 > 83 > C > 366-375
TENCON 2017 - 2017 IEEE Region 10 Conference > 494 - 499
Microelectronics Reliability > 2017 > 78 > C > 205-211
IEEE Transactions on Nuclear Science > 2017 > 64 > 9 > 2489 - 2496
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 9 > 1580 - 1591
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 9 > 1497 - 1510
Microelectronics Reliability > 2017 > 76-77 > C > 660-664
Microelectronics Journal > 2017 > 67 > C > 143-154
IEEE Computer Architecture Letters > 2017 > 16 > 2 > 103 - 106