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IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1476 - 1482
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 92 - 95
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 425 - 430
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 1960 - 1967
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 488 - 493