Search results for: S. Gerardin
TENCON 2017 - 2017 IEEE Region 10 Conference > 494 - 499
Metallurgical and Materials Transactions B > 2017 > 48 > 6 > 3316-3328
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2038 - 2045
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 421 - 426
2016 IEEE International Reliability Physics Symposium (IRPS) > 5C-1-1 - 5C-1-5
Inside NAND Flash Memories > 537-571
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2933 - 2940
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2398 - 2403
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2511 - 2516
Solid State Electronics > 2015 > 113 > Complete > 15-21
Microelectronics Reliability > 2014 > 54 > 9-10 > 2213-2216
2014 IEEE International Reliability Physics Symposium > 2B.3.1 - 2B.3.6
2014 IEEE International Reliability Physics Symposium > 5F.3.1 - 5F.3.6
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1799 - 1805
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3491 - 3496