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2011 International Reliability Physics Symposium > 6A.4.1 - 6A.4.6
IEEE Electron Device Letters > 2011 > 32 > 3 > 294 - 296
2010 IEEE International Reliability Physics Symposium > 1099 - 1104
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 193 - 202
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2669 - 2678