Search results for: M.N. Marbell
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 193 - 202
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3555 - 3561
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 193 - 202
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3555 - 3561