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IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4166 - 4174
2011 International Reliability Physics Symposium > 5A.3.1 - 5A.3.5
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1170 - 1175
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 317 - 323
IEEE Design & Test of Computers > 2009 > 26 > 6 > 40 - 49
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 193 - 202
IEEE Transactions on Electron Devices > 2008 > 55 > 10 > 2790 - 2794
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2669 - 2678