Wyniki wyszukiwania
Science China Information Sciences > 2016 > 59 > 12 > 1-9
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 536 - 544
2013 IEEE International Reliability Physics Symposium (IRPS) > EL.2.1 - EL.2.6
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1011 - 1018
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 3 > 178 - 182
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3456 - 3463
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 474 - 483
IEEE Journal of Solid-State Circuits > 2010 > 45 > 11 > 2476 - 2486
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1636 - 1641
IEEE Transactions on Microwave Theory and Techniques > 2009 > 57 > 5-1 > 1044 - 1053
IEEE Transactions on Circuits and Systems II: Express Briefs > 2009 > 56 > 5 > 359 - 363
IEEE Journal of Solid-State Circuits > 2009 > 44 > 3 > 956 - 964
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 517 - 527
IEEE Transactions on Circuits and Systems I: Regular Papers > 2006 > 53 > 10 > 2187 - 2193