Search results
Journal of Computational Electronics > 2018 > 17 > 3 > 1315-1323
AEU - International Journal of Electronics and Communications > 2018 > 83 > C > 180-187
AEU - International Journal of Electronics and Communications > 2017 > 82 > C > 119-126
Microelectronics Reliability > 2017 > 69 > C > 1-16
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1821 - 1826
IEEE Transactions on Circuits and Systems II: Express Briefs > 2016 > 63 > 2 > 156 - 160
Superlattices and Microstructures > 2016 > 90 > C > 198-206
IET Circuits, Devices & Systems > 2016 > 10 > 1 > 62 - 67
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 567 - 575
Indian Journal of Physics > 2015 > 89 > 9 > 943-950
Current Applied Physics > 2014 > 14 > Supplement 1 > S98-S102
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 477 - 483
Journal of Electronic Testing > 2014 > 30 > 4 > 415-423